A general approach to defect detection in textured materials using a wavelet domain model and level sets


Journal article


H. Chan, C. Raju, H. Sari-Sarraf, E. Hequet
SPIE Optics East, 2005

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APA   Click to copy
Chan, H., Raju, C., Sari-Sarraf, H., & Hequet, E. (2005). A general approach to defect detection in textured materials using a wavelet domain model and level sets. SPIE Optics East.


Chicago/Turabian   Click to copy
Chan, H., C. Raju, H. Sari-Sarraf, and E. Hequet. “A General Approach to Defect Detection in Textured Materials Using a Wavelet Domain Model and Level Sets.” SPIE Optics East (2005).


MLA   Click to copy
Chan, H., et al. “A General Approach to Defect Detection in Textured Materials Using a Wavelet Domain Model and Level Sets.” SPIE Optics East, 2005.


BibTeX   Click to copy

@article{h2005a,
  title = {A general approach to defect detection in textured materials using a wavelet domain model and level sets},
  year = {2005},
  journal = {SPIE Optics East},
  author = {Chan, H. and Raju, C. and Sari-Sarraf, H. and Hequet, E.}
}